An edition of Surface scattering and diffraction for advanced metrology (2001)

Surface scattering and diffraction for advanced metrology

1 August 2001, San Diego, USA

by and

Cover of: Surface scattering and diffraction for advanced metrology by Zu-Han Gu, A. A. Maradudin
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Last edited by MARC Bot
November 14, 2023 | History
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An edition of Surface scattering and diffraction for advanced metrology (2001)

Surface scattering and diffraction for advanced metrology

1 August 2001, San Diego, USA

by and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
SPIE
Language
English
Pages
164

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Previews available in: English

Subjects

Congresses, Metrology, Scattering (Physics), Measurement, Surface roughness, Optical measurements, Diffractive scattering
Edition Availability
Cover of: Surface scattering and diffraction for advanced metrology
Surface scattering and diffraction for advanced metrology: 1 August 2001, San Diego, USA
2001, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash., USA
Series
SPIE proceedings series ;, v. 4447, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4447.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TA418.7 .S928 2001

The Physical Object

Pagination
vii, 164 p. :
Number of pages
164

ID Numbers

Open Library
OL3579513M
ISBN 10
0819441619
LCCN
2002265497
OCLC/WorldCat
48545937
Goodreads
6780338

Source records

Scriblio MARC record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 14, 2023 Edited by MARC Bot import existing book
June 12, 2023 Edited by ImportBot import existing book
December 5, 2020 Edited by MARC Bot import existing book
February 19, 2019 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record