Surface scattering and diffraction for advanced metrology II

9 July, 2002, Seattle, Washington, USA

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today


Buy this book

Last edited by MARC Bot
November 15, 2023 | History

Surface scattering and diffraction for advanced metrology II

9 July, 2002, Seattle, Washington, USA

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
SPIE
Language
English
Pages
186

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
SPIE proceedings series ;, v. 4780, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4780.
Genre
Congresses.

Classifications

Dewey Decimal Class
620/.44
Library of Congress
TA418.7 .S929 2002, TA418.7.S929 2002

The Physical Object

Pagination
vii, 186 p. :
Number of pages
186

ID Numbers

Open Library
OL3774869M
ISBN 10
0819445479
LCCN
2003535276
OCLC/WorldCat
51110642
Goodreads
5003878

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 15, 2023 Edited by MARC Bot import existing book
June 12, 2023 Edited by ImportBot import existing book
December 8, 2020 Edited by MARC Bot import existing book
October 8, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record