Microscopic identification of electronic defects in semiconductors

symposium held April 15-18, 1985, San Francisco, California, U.S.A.

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Last edited by MARC Bot
February 18, 2019 | History

Microscopic identification of electronic defects in semiconductors

symposium held April 15-18, 1985, San Francisco, California, U.S.A.

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Publish Date
Language
English
Pages
604

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Previews available in: English

Book Details


Edition Notes

Includes bibliographies and indexes.

Published in
Pittsburgh, Pa
Series
Materials Research Society symposia proceedings,, v. 46

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .M53 1985

The Physical Object

Pagination
xv, 604 p. :
Number of pages
604

ID Numbers

Open Library
OL2538790M
Internet Archive
microscopicident0000unse
ISBN 10
0931837111
LCCN
85019753
OCLC/WorldCat
12557554
Goodreads
3481278

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February 18, 2019 Created by MARC Bot import existing book