An edition of Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
(1988)
Integrated circuit metrology, inspection, and process control II
29 February-1 March 1988, Santa Clara, California
by Kevin M. Monahan
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Subjects
Congresses, Inspection, Integrated circuits, Measurement| Edition | Availability |
|---|---|
1
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE--the International Society for Optical Engineering
in English
0892529563 9780892529568
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2
Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
August 1988, Society of Photo Optical
Paperback
0892529563 9780892529568
|
zzzz
|
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3
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE
in English
0892529563 9780892529568
|
zzzz
|
Book Details
Edition Notes
Includes bibliographies and index.
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- Created November 4, 2008
- 3 revisions
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL9251062W |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| November 4, 2008 | Created by ImportBot | Imported from Oregon Libraries MARC record |