An edition of Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
(1988)
Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
by Kevin M. Monahan
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Congresses, Inspection, Integrated circuits, Measurement| Edition | Availability |
|---|---|
1
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE
in English
0892529563 9780892529568
|
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2
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE--the International Society for Optical Engineering
in English
0892529563 9780892529568
|
zzzz
|
|
3
Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
August 1988, Society of Photo Optical
Paperback
0892529563 9780892529568
|
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- Created April 30, 2008
- 7 revisions
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| July 23, 2024 | Edited by MARC Bot | import existing book |
| April 2, 2019 | Edited by MARC Bot | import existing book |
| March 10, 2019 | Edited by MARC Bot | import existing book |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |