An edition of CMOS gate-stack scaling-- materials, interfaces and reliability implications (2009)

CMOS gate-stack scaling-- materials, interfaces and reliability implications

symposium held April 14-16, 2009, San Francisco, california, U.S.A.

by

CMOS gate-stack scaling-- materials, interfac ...
Alexander A. Demkov, Alexander ...
Locate

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
Notes

Check nearby libraries

Buy this book

Last edited by MARC Bot
January 1, 2023 | History
Edit
An edition of CMOS gate-stack scaling-- materials, interfaces and reliability implications (2009)

CMOS gate-stack scaling-- materials, interfaces and reliability implications

symposium held April 14-16, 2009, San Francisco, california, U.S.A.

by

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Materials Research Society
Language
English
Pages
179

Check nearby libraries

Buy this book

Subjects

Complementary Metal oxide semiconductors, Materials, Congresses, Silicides, Metal oxide semiconductors, Gate array circuits, Metal oxide semiconductors, complementary
Edition Availability
Cover of: CMOS gate-stack scaling-- materials, interfaces and reliability implications
CMOS gate-stack scaling-- materials, interfaces and reliability implications: symposium held April 14-16, 2009, San Francisco, california, U.S.A.
2009, Materials Research Society
in English

Add another edition?

Book Details

Edition Notes

" ... Symposium C, 'CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- preface.

Includes bibliographical references and indexes.

Published in
Warrendale, Pa
Series
MRS proceedings -- v. 1155, Materials Research Society symposia proceedings -- v. 1155.

Classifications

Library of Congress
TK7871.99.M44 C5725 2009, TK7871.99.M44 C5725

The Physical Object

Pagination
viii, 179 p. :
Number of pages
179

ID Numbers

Open Library
OL25177911M
ISBN 10
1605111287
ISBN 13
9781605111285
LCCN
2011294341
OCLC/WorldCat
505804375

Source records

Library of Congress MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record
harvard_bibliographic_metadata record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
January 1, 2023 Edited by MARC Bot import existing book
December 25, 2022 Edited by MARC Bot import existing book
October 12, 2020 Edited by MARC Bot import existing book
October 9, 2020 Edited by ImportBot import existing book
January 25, 2012 Created by LC Bot Imported from Library of Congress MARC record