CMOS gate-stack scaling-- materials, interfaces and reliability implications

symposium held April 14-16, 2009, San Francisco, california, U.S.A.

CMOS gate-stack scaling-- materials, interfac ...
Alexander A. Demkov, Alexander ...
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Last edited by ImportBot
August 2, 2020 | History

CMOS gate-stack scaling-- materials, interfaces and reliability implications

symposium held April 14-16, 2009, San Francisco, california, U.S.A.

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Publish Date
Language
English
Pages
179

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Book Details


Edition Notes

" ... Symposium C, 'CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- preface.

Includes bibliographical references and indexes.

Published in
Warrendale, Pa
Series
MRS proceedings -- v. 1155, Materials Research Society symposia proceedings -- v. 1155.

Classifications

Library of Congress
TK7871.99.M44 C5725 2009, TK7871.99.M44 C5725

The Physical Object

Pagination
viii, 179 p. :
Number of pages
179

ID Numbers

Open Library
OL25177911M
ISBN 10
1605111287
ISBN 13
9781605111285
LCCN
2011294341
OCLC/WorldCat
505804375

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History

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August 2, 2020 Edited by ImportBot import existing book
January 25, 2012 Created by LC Bot import new book