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CMOS gate-stack scaling-- materials, interfaces and reliability implications: symposium held April 14-16, 2009, San Francisco, california, U.S.A.
2009, Materials Research Society
in English
1605111287 9781605111285
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Book Details
Edition Notes
" ... Symposium C, 'CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- preface.
Includes bibliographical references and indexes.
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Feedback?August 2, 2020 | Edited by ImportBot | import existing book |
January 25, 2012 | Created by LC Bot | import new book |