An edition of Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
(1988)
Integrated circuit metrology, inspection, and process control II
29 February-1 March 1988, Santa Clara, California
by Kevin M. Monahan
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Congresses, Inspection, Integrated circuits, Measurement| Edition | Availability |
|---|---|
1
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE
in English
0892529563 9780892529568
|
zzzz
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2
Integrated Circuit Metrology, Inspection and Process Control II (Spie, Vol 921)
August 1988, Society of Photo Optical
Paperback
0892529563 9780892529568
|
zzzz
|
|
3
Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California
1988, SPIE--the International Society for Optical Engineering
in English
0892529563 9780892529568
|
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|
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Includes bibliographies and index.
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| April 2, 2019 | Edited by MARC Bot | import existing book |
| March 10, 2019 | Edited by MARC Bot | import existing book |
| December 11, 2009 | Created by WorkBot | add works page |